This special feature titled “Time-of-flight secondary ion mass spectrometry imaging in cultural heritage: a focus on old paintings” is also the cover story of this month’s edition of the Journal of Mass Spectrometry. Lead author Caroline Bouvier created an excellent tutorial on how ToF-SIMS is used in modern cultural heritage research. I am very happy I was able to contribute as a co-author.
Bouvier C, Van Nuffel S, Walter P, Brunelle A. Time-of-flight secondary ion mass spectrometry imaging in cultural heritage: A focus on old paintings. J Mass Spectrom. 2022;57(1):e4803. doi:10.1002/jms.4803
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