Can you investigate forever chemicals with ToF-SIMS? Why yes, yes you can! You’ll need high quality, annotated reference spectra, though. In this Surface Science Spectra article, we provide positive and negative polarity ToF-SIMS reference spectra for two representative perfluorosulfonic acids (PFSA) along with a general description of the fragmentation pattern of linear PFSA. Kimberly G. Garcia, Sebastiaan Van Nuffel; ToF-SIMS reference spectra of perfluorosulfonic acids in

I recently had the opportunity to be interviewed by C2W | Mens & Molecule , the magazine focusing on Dutch chemistry. In the "Podium" section, which spotlights members of the Royal Netherlands Chemical Society (KNCV) , I was happy to share more about myself. The same issue also reported on the Next Generation Leaders in Dutch Chemistry  summit and mentioned the Vickerman Prize in their "Ons Kent Ons" section.

M4i had a strong presence at the SIMS Europe conference in Giessen, Germany! Caroline and Kimberly gave talks, Sara showcased a poster,...

A new reference paper that will interest SIMS users working with Si wafers as well as Au-coated or ITO-coated glass slides as their...

I received the 2025 Vickerman Prize at the summer meeting of the UK Surface Analysis Forum, and it now has pride of place on the wall of...

I traveled quite a bit during June and July. First, I participated in the 2nd North American Secondary Ion Mass Spectrometry Workshop ...

The RSC book containing a chapter co-authored by Kimberly was published online on June 6, 2025! Secondary Ion Mass Spectrometry:...

Kimberly has authored a technical note detailing the application of ToF-SIMS parallel MS/MS imaging for the analysis of lead soap species...

I am excited to share that the board of NWO Domain Science (ENW) has appointed me to serve as a member of the working community...

It was another great Chan Zuckerberg Initiative Imaging meeting in sunny Austin, TX. Once again, I left with a wealth of new research...

Two new publications have been released! Mariya Shamraeva’s tutorial on the application of a Random Forest classifier to ToF-SIMS imaging...

Caroline Bouvier was interviewed by UMagazine! This publication provides valuable insights into advancements and accomplishments in the...

Participating in the 24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24) held in La Rochelle, France, proved to...

On Friday, September 6th, Caroline Bouvier took part in the ninth edition of the Pleasure, Art & Science Festival (PAS) held in...

Last week, Mariya Shamraeva had the pleasure of attending the European Microscopy Congress 2024 in Copenhagen, Denmark, from 25 to 30...

Two months earlier, the special collection ToF-SIMS Spectra of Historical Inorganic Pigments was opened. Now, the initial set of six...

Last week, Edith Sandström (left) and Caroline Bouvier (right) attended the Gordon Research Conference on Scientific Methods in Cultural...

I greatly appreciated the opportunity to participate as an invited speaker at the joint 17th European Vacuum Conference (EVC) and 37th...

In the second half of May, I traveled to Brazil to first visit the Centro de Microscopia of the Universidade Federal de Minas Gerais,...

Caroline has published ToF-SIMS reference spectra for lead pigments in positive polarity in Surface Science Spectra, a peer-reviewed...