An upcoming special issue of the Journal of the American Society for Mass Spectrometry (JASMS) will focus on advanced data analysis in Secondary Ion Mass Spectrometry (SIMS). Gustavo F. Trindade and I are serving as guest editors for this issue, which we believe is particularly relevant given all the recent advancements in this field. Researchers working on machine learning and advanced image processing applied to SIMS data are encouraged to submit their manuscripts by the deadline of July 31, 2024.
More info: https://go.acs.org/JS_SIMS_CFP